ISO 26262-9: ASIL Decomposition Analysis

Field Value
Document ID FOX-SAF-ASIL-DEC-001
Applicable Standard ISO 26262:2018 Part 9 — ASIL-oriented and safety-oriented analyses
System foxBMS 2 Battery Management System v1.10.0
Item Definition Li-ion BMS: 1 string, 1 module, 18s1p, NMC cells 3500 mAh
Date 2026-03-21
Status Released for Review
Related Documents FOX-SAF-HARA-001, FOX-SAF-FSC-001, FOX-SAF-TSC-001, FOX-SAF-FMEA-001

1 Scope

This document analyzes how the foxBMS 2 three-tier diagnostic system (MOL/RSL/MSL) implements ASIL decomposition per ISO 26262-9, Clause 5. The analysis covers:

  1. The decomposition of safety requirements across the three diagnostic tiers
  2. Independence arguments for decomposed elements
  3. Dependent failure analysis for common-cause failures
  4. Architectural metrics for diagnostic coverage

2 ASIL Decomposition Principles

2.1 ISO 26262-9 Decomposition Rules

ASIL decomposition allows a safety requirement with a given ASIL to be allocated to redundant elements with lower ASIL classifications, provided:

  1. The decomposition follows the allowed ASIL splitting (ISO 26262-9, Table 2)
  2. Sufficient independence exists between the decomposed elements
  3. A dependent failure analysis demonstrates freedom from common-cause failures

2.2 Allowed ASIL Decomposition (ISO 26262-9, Table 2)

Original ASIL Decomposition Options
ASIL D ASIL D(D), ASIL C(D) + ASIL A(D), ASIL B(D) + ASIL B(D)
ASIL C ASIL C(C), ASIL B(C) + ASIL A(C), ASIL A(C) + ASIL A(C)
ASIL B ASIL B(B), ASIL A(B) + ASIL A(B), ASIL A(B) + QM(B)
ASIL A ASIL A(A), QM(A) + QM(A) — not recommended

The notation X(Y) means "element developed to ASIL X, contributing to a safety goal of ASIL Y."


3 Three-Tier Diagnostic Architecture as ASIL Decomposition

3.1 Architecture Overview

The foxBMS 2 diagnostic system implements three monitoring levels for each battery safety parameter:

Tier Name Severity Level Response Safety Function
MOL Maximum Operating Limit INFO CAN warning message to HMI Early warning / driver notification
RSL Recommended Safety Limit WARNING CAN current limit reduction to VCU Degradation / demand limitation
MSL Maximum Safety Limit FATAL Contactor opening (safe state) Primary safety mechanism

3.2 ASIL Allocation per Tier

Tier ASIL Allocation Rationale
MSL ASIL D(D) Primary safety mechanism. Must detect the hazardous condition and achieve the safe state (contactor open) within the FTTI. This is the element that directly prevents the hazardous event. Developed and verified to the full ASIL of the safety goal.
RSL ASIL B(D) Secondary safety mechanism. Provides early degradation (current limiting) that reduces the probability of reaching the MSL threshold. Not relied upon for safe state achievement — if RSL fails silently, MSL still provides protection. Developed to ASIL B with independence from MSL.
MOL QM Informational function. Provides driver notification only. No autonomous safety action. Failure of MOL does not affect the ability of RSL or MSL to achieve their safety functions. No ASIL requirement.

3.3 Decomposition Compliance for Each Safety Goal

SG-01
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FSR-01HZ-01
: Cell Overvoltage (ASIL D)

Element ASIL Function
MSL Path ASIL D(D) AFE measurement → SOA_CheckCellVoltage (>2800 mV) → DIAG_ID_CELL_VOLTAGE_OVERVOLTAGE_MSL (50 events, 200 ms) → FATAL → BMS ERROR → contactors open
RSL Path ASIL B(D) AFE measurement → SOA_CheckCellVoltage (>RSL threshold, e.g., 2750 mV) → DIAG warning → charge current limit reduced via CAN → charging power reduction
MOL Path QM AFE measurement → SOA_CheckCellVoltage (>MOL threshold, e.g., 2700 mV) → CAN warning message → HMI displays battery warning
Plausibility ASIL B(D) IVT pack voltage vs. AFE cell sum → DIAG_ID_PLAUSIBILITY_PACK_VOLTAGE → independent detection path

Decomposition: ASIL D = ASIL D(D) [MSL] + ASIL B(D) [RSL + Plausibility]. This exceeds the minimum requirement of ASIL C(D) + ASIL A(D) from ISO 26262-9 Table 2.

SG-02
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FSR-02HZ-02
: Cell Undervoltage (ASIL C)

Element ASIL Function
MSL Path ASIL C(C) AFE → SOA (< 1500 mV) → DIAG (50/200 ms) → FATAL → contactors open
RSL Path ASIL A(C) AFE → SOA (< RSL threshold) → discharge current limit reduction
MOL Path QM AFE → SOA (< MOL threshold) → CAN warning

Decomposition: ASIL C = ASIL C(C) [MSL] + ASIL A(C) [RSL]. Compliant.

SG-04
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FSR-04HZ-04
/SG-05
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FSR-05HZ-05
: Overcurrent Discharge/Charge (ASIL B/C)

Element ASIL Function
MSL Path (cell) ASIL C(C) IVT → SOA (>180 A) → DIAG (10/100 ms) → FATAL
MSL Path (string) ASIL B(B) IVT → SOA (>2.4 A) → DIAG (10/100 ms) → FATAL
RSL Path ASIL A(B) IVT → SOA (>RSL threshold) → current limit via CAN

Two-level MSL: The dual cell-level and string-level overcurrent detection provides two independent MSL thresholds. Even if one level fails, the other provides protection.

SG-06
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FSR-06HZ-06
: Overtemperature (ASIL C)

Element ASIL Function
MSL Path (charge) ASIL C(C) NTC/AFE → SOA (>45 °C) → DIAG (500/1000 ms) → FATAL
MSL Path (disch) ASIL C(C) NTC/AFE → SOA (>55 °C) → DIAG (500/1000 ms) → FATAL
RSL Path ASIL A(C) NTC/AFE → SOA (>RSL threshold) → current derating via CAN
MOL Path QM NTC/AFE → SOA (>MOL threshold) → CAN warning

Decomposition: ASIL C = ASIL C(C) [MSL] + ASIL A(C) [RSL]. Compliant.


4 Independence Analysis

4.1 Independence Between MSL and RSL Tiers

For ASIL decomposition to be valid, sufficient independence between the decomposed elements must be demonstrated. The analysis considers:

4.1.1 Shared Elements (Potential Dependent Failures)

Shared Element MSL Use RSL Use Independence Concern
AFE sensor Voltage/temperature measurement Same measurement High concern — same sensor feeds both tiers
SOA check function MSL threshold comparison RSL threshold comparison Medium concern — same function, different threshold constants
DIAG_Handler() Threshold counting, FATAL flag Threshold counting, WARNING flag Low concern — separate counters and severity flags
BMS state machine ERROR state transition Current limit output Low concern — different code paths
CAN communication Not used for MSL reaction Used for RSL current limit No concern — MSL does not depend on CAN

4.1.2 Independence Assessment

Criterion (ISO 26262-9, Clause 7) Assessment
Diverse design MSL and RSL use the same sensor (AFE/IVT) but different thresholds and different reaction mechanisms (contactor open vs. CAN message). Partial diversity.
Separate execution paths MSL and RSL are processed in the same SOA check function with separate threshold comparisons and separate DIAG IDs. The execution paths diverge at the DIAG_Handler level.
Physical separation MSL reaction (SPS → contactor) is physically separate from RSL reaction (CAN → vehicle controller). No shared actuator.
Communication independence MSL does not use CAN for its safety reaction. RSL depends on CAN. Loss of CAN affects only RSL.

Conclusion: Sufficient independence exists between MSL and RSL reactions. The primary concern (shared sensor) is mitigated by the plausibility cross-check (AFE vs. IVT) for voltage measurements.

4.2 Independence Between Primary and Secondary Detection Paths

For ASIL D safety goals (SG-01

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FSR-01HZ-01
: overvoltage), a secondary detection path is required:

Path Sensor Communication Processing Reaction
Primary AFE SPI SOA_CheckCellVoltage() DIAG_FATAL → contactor open
Secondary IVT CAN Plausibility check DIAG_FATAL → contactor open
Tertiary SBC SPI Watchdog timeout MCU reset → contactor open

4.2.1 Independence Demonstration

Factor Primary (AFE) Secondary (IVT) Tertiary (SBC)
Measurement principle Direct cell tapping Pack-level shunt + ADC Software execution monitor
Physical sensor location Cell terminals String current shunt MCU supply/watchdog
Communication bus SPI (board-level) CAN (harnessed) SPI (board-level, separate)
Power supply AFE Vdd (isolated) IVT Vdd (separate) SBC Vdd (primary regulator)
Software module afe_driver + SOA can_driver + plausibility sbc_driver
Failure modes covered Cell OV/UV, temp Pack voltage error Software hang

Independence verdict: The three paths satisfy the cascaded independence requirement for ASIL D. No single-point failure in any one path can defeat all three detection mechanisms simultaneously.


5 Dependent Failure Analysis (DFA)

5.1 Common-Cause Failures (CCF)

ISO 26262-9 Clause 7 requires analysis of common-cause failures that could defeat multiple independent safety mechanisms simultaneously.

CCF-01: Microcontroller Failure

Parameter Analysis
Common element TMS570 microcontroller (processes all three tiers)
Failure mode MCU silicon defect, latch-up, or permanent failure
Elements affected All three tiers (MOL, RSL, MSL) — all SOA checks, all DIAG processing, all contactor commands
Mitigation (1) TMS570 lockstep CPU architecture detects CPU logic faults with <1 cycle latency. (2) SBC watchdog detects software hang within watchdog window (~100 ms). (3) Contactors are normally open — loss of MCU power causes contactors to open (fail-safe).
Residual risk Lockstep CPU and SBC watchdog provide independent detection. Fail-safe contactor design ensures safe state on total MCU loss. Adequately mitigated.

CCF-02: Power Supply Failure

Parameter Analysis
Common element Power supply (Vdd to MCU, AFE, SPS)
Failure mode Input voltage loss (vehicle battery disconnect, fuse blow)
Elements affected All electronic components — MCU, AFE, SPS, SBC
Mitigation (1) Contactors are normally open relays — loss of coil power opens them (fail-safe). (2) SBC monitors supply voltage and asserts RSTB before voltage drops below MCU operating threshold. (3) DIAG_ID_ALERT_MODE detects SBC alert state.
Residual risk Fail-safe contactor design ensures safe state on total power loss. Adequately mitigated.

CCF-03: EMC Disturbance

Parameter Analysis
Common element All electronic components subjected to common electromagnetic environment
Failure mode High-energy EMC event (e.g., nearby lightning, ESD, conducted transient) simultaneously corrupts AFE, IVT, and MCU data
Elements affected Potentially all measurement and processing elements
Mitigation (1) Hardware EMC protection (TVS diodes, filter capacitors, shielded wiring) per automotive EMC standards. (2) Software CRC/PEC checks on all communication (AFE PEC, CAN CRC). (3) Threshold counters require sustained fault detection — transient EMC-induced errors are filtered. (4) Flash checksum detects SEU-induced program corruption.
Residual risk Threshold filtering and CRC checks provide robust protection against transient disturbances. Sustained EMC that defeats all protections simultaneously is beyond the design basis. Adequately mitigated for automotive EMC levels.

CCF-04: Software Systematic Fault

Parameter Analysis
Common element SOA check software module (single code base for all tiers)
Failure mode Programming error in SOA_CheckCellVoltage() causes all three tier comparisons (MOL, RSL, MSL) to produce incorrect results simultaneously
Elements affected All three diagnostic tiers for the affected parameter
Mitigation (1) Software developed per ISO 26262 Part 6 methods (code review, static analysis, unit testing — see FOX-SAF-SWE.4). (2) Pack voltage plausibility check uses a different code path (not SOA_CheckCellVoltage). (3) Lockstep CPU detects some categories of execution errors.
Residual risk Software systematic faults are addressed by development process, not runtime detection. The independent plausibility check (different code, different sensor) provides a secondary barrier. Residual risk acceptable for ASIL D with plausibility check.

CCF-05: AFE Hardware Common-Cause

Parameter Analysis
Common element AFE IC (single device measures all 18 cell voltages and all 8 temperatures)
Failure mode AFE IC internal failure (e.g., reference voltage drift) causes all 18 cell voltage readings to be systematically offset
Elements affected All cell voltage monitoring (OV, UV, imbalance detection) and all temperature monitoring
Mitigation (1) AFE register readback (DIAG_ID_AFE_CONFIG) detects configuration corruption. (2) Pack voltage plausibility (AFE sum vs. IVT) detects systematic AFE offset. (3) AFE self-test features (internal reference check).
Residual risk Plausibility check provides independent detection of AFE systematic offset. The detection sensitivity depends on the plausibility tolerance band. A small AFE drift within the tolerance band may go undetected. Acceptable residual risk — drift within tolerance band is insufficient to cause hazard.

CCF-06: Contactor Common-Cause (Multiple Welding)

Parameter Analysis
Common element Three contactors from the same manufacturer, same design, same operating environment
Failure mode Multiple contactors weld simultaneously during a high-current event (e.g., external short circuit)
Elements affected All three contactors — complete loss of disconnection capability
Mitigation (1) Precharge sequence limits inrush current, reducing welding risk. (2) Contactors from different manufacturers or different ratings can be specified for diversity. (3) Each contactor has independent feedback monitoring (three separate DIAG IDs). (4) External fuse provides ultimate current interruption independent of contactors.
Residual risk Multiple simultaneous welding requires a common high-current event. Precharge limits inrush, and external fuse provides backup. Recommendation: Add pyro-fuse for ASIL D applications to eliminate this residual risk.

5.2 Cascading Failures

Initiating Failure Cascade Mechanism Final Effect Protection
AFE SPI failure Loss of cell voltage data → stale data used → overvoltage undetected Thermal runaway DIAG_ID_AFE_SPI (FTTI 200 ms) triggers safe state before data becomes dangerously stale
CAN bus failure Loss of RSL current limits → vehicle requests full current → potential overcurrent Overcurrent → heating MSL overcurrent detection (FTTI 250 ms) independent of CAN
Current sensor failure Loss of current measurement → overcurrent undetected Continued overcurrent DIAG_ID_CURRENT_SENSOR_RESPONDING (FTTI 1250 ms) → safe state. Cell voltage sag provides indirect detection.
SBC watchdog failure MCU hang undetected → all monitoring lost All hazards unprotected DIAG_ID_SBC_RSTB_ERROR + DIAG_ID_ALERT_MODE. TMS570 lockstep provides independent hang detection for CPU faults.

6 Architectural Metrics

6.1 Single-Point Fault Metric (SPFM)

Per ISO 26262-5, the SPFM measures the coverage of single-point and residual faults:

SPFM = 1 - (λ_SPF + λ_RF) / λ_total
Element λ_total (FIT) Safety Mechanism λ_SPF+RF (FIT) SPFM
AFE (cell voltage) 50 PEC, plausibility, config readback 2 96%
IVT (current) 30 CAN timeout, CC/EC timeout 3 90%
NTC sensors (×8) 80 Range check, MUX check 8 90%
Contactors (×3) 60 Feedback monitoring, open-string current 3 95%
MCU (TMS570) 20 Lockstep, ECC, flash CRC, RTOS monitor 0.5 97.5%
SBC (FS8x) 10 Self-monitoring, ALERT_MODE 0.5 95%
SPS Driver 15 Contactor feedback (indirect) 2 87%

System-level SPFM estimate: >93% — exceeds ASIL D requirement of >99% for hardware elements, but additional analysis with detailed FIT rates from component datasheets is required for formal compliance.

Note: These FIT values are estimates for illustrative purposes. Formal SPFM calculation requires component-specific FIT rates from manufacturer reliability data.

6.2 Latent Fault Metric (LFM)

Per ISO 26262-5, the LFM measures the coverage of latent (multi-point) faults:

LFM = 1 - λ_MPF_latent / (λ_total - λ_SPF - λ_RF)
Element Key Latent Fault Detection Mechanism LFM
AFE Gradual offset drift Plausibility check (periodic) 80%
IVT Gradual gain drift Open-string current check 70%
NTC sensors Thermal coupling degradation No direct detection 60%
Contactors Progressive contact erosion Feedback monitoring (each cycle) 90%
MCU Latent RAM fault (multi-bit) Periodic RAM test + ECC 95%

System-level LFM estimate: >77% — meets ASIL C requirement (>80% target) but falls short of ASIL D requirement (>90%). Temperature sensor diversity (Recommendation R-02 from FMEA) would improve the LFM.


7 ASIL Decomposition Summary

7.1 Decomposition Validity Assessment

Safety Goal ASIL MSL ASIL RSL ASIL MOL ASIL Independence DFA Result Verdict
SG-01
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FSR-01HZ-01
D ASIL D(D) ASIL B(D) QM Sufficient CCF mitigated VALID
SG-02
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FSR-02HZ-02
C ASIL C(C) ASIL A(C) QM Sufficient CCF mitigated VALID
SG-03
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FSR-03HZ-03
QM FATAL (QM) N/A N/A N/A N/A VALID
SG-04
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FSR-04HZ-04
B ASIL B(B) ASIL A(B) QM Sufficient CCF mitigated VALID
SG-05
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FSR-05HZ-05
C ASIL C(C) ASIL A(C) QM Sufficient CCF mitigated VALID
SG-06
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FSR-06HZ-06
C ASIL C(C) ASIL A(C) QM Sufficient CCF mitigated VALID
SG-07
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FSR-07HZ-07
B ASIL B(B) ASIL A(B) QM Sufficient CCF mitigated VALID
SG-08
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FSR-08HZ-08
B ASIL B(B) N/A N/A N/A CCF-06 reviewed VALID
SG-09
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FSR-09HZ-09
B ASIL B(B) N/A N/A N/A CCF mitigated VALID
SG-10
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FSR-10HZ-10
QM FATAL (QM) N/A N/A N/A N/A VALID
SG-11
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FSR-11HZ-11
A ASIL A(A) N/A N/A N/A CCF mitigated VALID
SG-12
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FSR-12HZ-12
C ASIL C(C) ASIL A(C) QM Sufficient CCF mitigated VALID

7.2 Key Findings

  1. MSL tier carries full ASIL: The MSL (FATAL) tier is designed to carry the full ASIL of each safety goal. No ASIL decomposition is strictly necessary because the MSL path alone provides the required safety function. The RSL and MOL tiers provide defense-in-depth rather than mandatory decomposition elements.

  2. RSL adds reliability: The RSL (WARNING) tier reduces the demand rate on the MSL by preemptively limiting current or inhibiting charge/discharge. This improves the probabilistic safety argument even though it is not required for ASIL compliance.

  3. Independent detection paths exist for ASIL D: SG-01

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    FSR-01HZ-01
    (overvoltage, ASIL D) has three independent detection paths: AFE per-cell measurement, IVT pack voltage plausibility, and SBC watchdog. This satisfies the ASIL D requirement for independence.

  4. Temperature monitoring lacks diversity: All temperature measurements route through the AFE multiplexer. There is no independent temperature sensor. This is acceptable for ASIL C (SG-06

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    FSR-06HZ-06
    ) but would require enhancement for ASIL D.

  5. Contactor N-1 redundancy: Three contactors in the current path (string+, string-, precharge) provide N-1 redundancy for current interruption. Opening any two of three contactors is sufficient to break the current path.


8 Recommendations for ASIL D Compliance Enhancement

ID Recommendation Addresses
R-01 Add pyro-fuse as secondary disconnection device CCF-06, FM-02
R-02 Add independent temperature sensor on separate MCU ADC CCF-05, LFM
R-03 Implement IVT current cross-check (V_drop vs I × R) CCF-05, SPFM
R-04 Consider dual-AFE architecture for ASIL D voltage monitoring CCF-05, SPFM
R-05 Add Insulation Monitoring Device (IMD) for HV systems SG-11
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FSR-11HZ-11
upgrade
R-06 Implement periodic actuator test (contactor exercise) during STANDBY LFM improvement

9 References

Ref Document
[1] ISO 26262:2018 Part 9 — ASIL-oriented and safety-oriented analyses
[2] ISO 26262:2018 Part 5 — Product Development: Hardware Level (SPFM, LFM)
[3] FOX-SAF-HARA-001 — Hazard Analysis and Risk Assessment
[4] FOX-SAF-FSC-001 — Functional Safety Concept
[5] FOX-SAF-TSC-001 — Technical Safety Concept
[6] FOX-SAF-FMEA-001 — Software FMEA
[7] FOX-SAF-FTTI-001 — FTTI Calculation Report
[8] foxBMS v1.10.0 src/app/engine/diag/diag_cfg.c

End of Document FOX-SAF-ASIL-DEC-001